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A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review | Abstract

Der Pharma Chemica
Journal for Medicinal Chemistry, Pharmaceutical Chemistry, Pharmaceutical Sciences and Computational Chemistry

ISSN: 0975-413X
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Abstract

A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review

Author(s): Ho Soonmin

Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytical problems effectively. In this work, the characterization of thin films prepared under various deposition conditions by using scanning electron microscopy was discussed and reported.


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